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1. Identity statement
Reference TypeJournal Article
Sitemtc-m21b.sid.inpe.br
Holder Codeisadg {BR SPINPE} ibi 8JMKD3MGPCW/3DT298S
Identifier8JMKD3MGP3W34P/3MRJP2L
Repositorysid.inpe.br/mtc-m21b/2016/11.22.18.12   (restricted access)
Last Update2016:11.22.18.12.11 (UTC) administrator
Metadata Repositorysid.inpe.br/mtc-m21b/2016/11.22.18.12.11
Metadata Last Update2018:06.04.02.41.21 (UTC) administrator
DOI10.1063/1.4964610
ISSN2166-532X
Citation KeyFornariRaMoPeBeReAb:2016:PrPrBi
TitlePreservation of pristine Bi2Te3 thin film topological insulator surface after ex situ mechanical removal of Te capping layer
Year2016
MonthOct.
Access Date2024, May 18
Type of Workjournal article
Secondary TypePRE PI
Number of Files1
Size5140 KiB
2. Context
Author1 Fornari, Celso Israel
2 Rappl, Paulo Henrique de Oliveira
3 Morelhão, S. L.
4 Peixoto, T. R. F.
5 Bentmann, H.
6 Reinert, F.
7 Abramof, Eduardo
Resume Identifier1
2 8JMKD3MGP5W/3C9JJ37
3
4
5
6
7 8JMKD3MGP5W/3C9JGUH
Group1 CMS-ETES-SPG-INPE-MCTI-GOV-BR
2 LAS-CTE-INPE-MCTI-GOV-BR
3
4
5
6
7 LAS-CTE-INPE-MCTI-GOV-BR
Affiliation1 Instituto Nacional de Pesquisas Espaciais (INPE)
2 Instituto Nacional de Pesquisas Espaciais (INPE)
3 Universidade de São Paulo (USP)
4 Universität Würzburg
5 Universität Würzburg
6 Universität Würzburg
7 Instituto Nacional de Pesquisas Espaciais (INPE)
Author e-Mail Address1 celso.fornari@inpe.br
2 paulo.rappl@inpe.br
3
4
5
6
7 eduardo.abramof@inpe.br
JournalAPL Materials
Volume4
Number10
Pages106107
History (UTC)2016-11-22 18:12:54 :: simone -> administrator :: 2016
2018-06-04 02:41:21 :: administrator -> simone :: 2016
3. Content and structure
Is the master or a copy?is the master
Content Stagecompleted
Transferable1
Content TypeExternal Contribution
Version Typepublisher
AbstractEx situ analyses on topological insulator films require protection against surface contamination during air exposure. This work reports on a technique that combines deposition of protective capping just after epitaxial growth and its mechanical removal inside ultra-high vacuum systems. This method was applied to Bi2Te3 films with thickness varying from 8 to 170 nm. Contrarily to other methods, this technique does not require any sputtering or thermal annealing setups installed inside the analyzing system and preserves both film thickness and surface characteristics. These results suggest that the technique presented here can be expanded to other topological insulator materials.
AreaFISMAT
Arrangement 1urlib.net > BDMCI > Fonds > Produção anterior à 2021 > LABAS > Preservation of pristine...
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4. Conditions of access and use
Languageen
User Groupself-uploading-INPE-MCTI-GOV-BR
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Reader Groupadministrator
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Visibilityshown
Read Permissiondeny from all and allow from 150.163
Update Permissionnot transferred
5. Allied materials
Linking8JMKD3MGP7W/3DHMCJ2
Mirror Repositoryurlib.net/www/2011/03.29.20.55
Next Higher Units8JMKD3MGPCW/3ESR3H2
8JMKD3MGPCW/3F358GL
Citing Item Listsid.inpe.br/mtc-m21/2012/07.13.14.57.50 4
sid.inpe.br/mtc-m21/2012/07.13.14.44.57 4
sid.inpe.br/bibdigital/2013/09.24.19.30 1
DisseminationWEBSCI; PORTALCAPES; SCOPUS.
Host Collectionsid.inpe.br/mtc-m21b/2013/09.26.14.25.20
6. Notes
Empty Fieldsalternatejournal archivingpolicy archivist callnumber copyholder copyright creatorhistory descriptionlevel e-mailaddress format isbn keywords label lineage mark nextedition notes orcid parameterlist parentrepositories previousedition previouslowerunit progress project rightsholder schedulinginformation secondarydate secondarykey secondarymark session shorttitle sponsor subject targetfile tertiarytype url
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